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 74F827 * 74F828 10-Bit Buffers/Line Drivers
April 1988 Revised October 2000
74F827 * 74F828 10-Bit Buffers/Line Drivers
General Description
The 74F827 and 74F828 10-bit bus buffers provide high performance bus interface buffering for wide data/address paths or buses carrying parity. The 10-bit buffers have NOR output enables for maximum control flexibility. The 74F828 is an inverting version of the 74F827.
Features
s 3-STATE output s 74F828 is inverting
Ordering Code:
Order Number 74F827SC 74F827SPC 74F828SC 74F828SPC Package Number M24B N24C M24B N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter "X" to the ordering code.
Connection Diagrams
74F827 74F828
(c) 2000 Fairchild Semiconductor Corporation
DS009598
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74F827 * 74F828
Logic Symbols
74F827 74F828
IEEE/IEC 74F827
IEEE/IEC 74F828
Unit Loading/Fan Out
Pin Names OE1, OE2 D0-D7 O0-O7 Description Output Enable Input Data Inputs Data Outputs, 3-STATE U.L. HIGH/LOW 1.0/1.0 1.0/1.0 600/106.6 (80) Input IIH/IIL Output IOH/IOL 20 A/-0.6 mA 20 A/-0.6 mA
-12 mA/64 mA (48 mA)
Functional Description
The 74F827 and 74F828 are line drivers designed to be employed as memory address drivers, clock drivers and bus-oriented transmitters/receivers which provide improved PC board density. The devices have 3-STATE outputs controlled by the Output Enable (OE) pins. The outputs can sink 64 mA and source 15 mA. Input clamp diodes limit high-speed termination effects.
Function Table
Inputs OE L L H Dn 74F827 H L X H L Z Outputs On 74F828 L H Z Transparent Transparent High Z Function
H = HIGH Voltage level L = LOW Voltage Level Z = High Impedance X = Immaterial
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74F827 * 74F828
Logic Diagrams
74F827
74F828
Please note that these diagrams are provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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74F827 * 74F828
Absolute Maximum Ratings(Note 1)
Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output 3-STATE Output Current Applied to Output in LOW State (Max) twice the rated IOL (mA)
-65C to +150C -55C to +125C -55C to +150C -0.5V to +7.0V -0.5V to +7.0V -30 mA to +5.0 mA
Recommended Operating Conditions
Free Air Ambient Temperature Supply Voltage 0C to +70C
+4.5V to +5.5V
-0.5V to VCC -0.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol VIH VIL VCD VOH Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage VOL IIH IBVI ICEX VID IOD IIL IOZH IOZL IOS IZZ ICCH ICCL ICCZ ICCH ICCL ICCZ Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test Output Leakage Circuit Current Input LOW Current Output Leakage Current Output Leakage Current Output Short-Circuit Current Bus Drainage Test Power Supply Current (74F827) Power Supply Current (74F827) Power Supply Current (74F827) Power Supply Current (74F828) Power Supply Current (74F828) Power Supply Current (74F828) 30 60 40 14 56 35 -100 4.75 3.75 -0.6 50 -50 -225 500 45 90 60 20 85 50 10% VCC 10% VCC 5% VCC 10% VCC 2.4 2.0 2.7 0.55 5.0 7.0 50 V A A A V A mA A A mA A mA mA mA mA mA mA Min Max Max Max 0.0 0.0 Max Max Max Max 0.0V Max Max Max Max Max Max V Min Min 2.0 0.8 -1.2 Typ Max Units V V V Min VCC Conditions Recognized as a HIGH Signal Recognized as a LOW Signal IIN = -18 mA IOH = -3 mA IOH = -15 mA IOH = -3 mA IOL = 64 mA VIN = 2.7V VIN = 7.0V VOUT = VCC IID = 1.9 A All Other Pins Grounded VIOD = 150 mV All Other Pins Grounded VIN = 0.5V VOUT = 2.7V VOUT = 0.5V VOUT = 0V VOUT = 5.25V VO = HIGH VO = LOW VO = HIGH Z VO = HIGH VO = LOW VO = HIGH Z
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74F827 * 74F828
AC Electrical Characteristics
TA = +25C Symbol Parameter Min tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ Propagation Delay Data to Output (74F827) Propagation Delay Data to Output (74F828) Output Enable Time OE to On Output Disable Time OE to On 1.0 1.5 1.0 1.0 3.0 3.5 1.5 1.0 VCC = +5.0V CL = 50 pF Typ 3.0 3.3 3.0 2.0 5.7 6.8 3.3 3.5 Max 5.5 5.5 5.0 4.0 9.0 11.5 8.0 8.0 2.5 3.0 1.5 1.0 10.0 12.5 9.0 9.0 TA = -55C to +125C VCC = +5.0V CL = 50 pF Min 1.0 1.5 Max 7.5 7.0 TA = 0C to +70C VCC = +5.0V CL = 50 pF Min 1.0 1.5 1.0 1.0 2.5 3.0 1.5 1.0 Max 6.5 6.0 5.5 4.0 9.5 12.0 8.5 8.5 ns ns ns ns Units
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74F827 * 74F828
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B
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74F827 * 74F828 10-Bit Buffers/Line Drivers
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 7 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com
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